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1

Long-term reliability of Ti–Pt–Au metallization system for Schottky contact and first-level metallization on SiC MESFET

A Sozza, C Dua, A Kerlain, C Brylinski, E Zanoni

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 392 KB

english, 2004

2

A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications

A. Sozza, C. Dua, E. Morvan, B. Grimber, S.L. Delage

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 490 KB

english, 2005

3

AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements

A. Sozza, A. Curutchet, C. Dua, N. Malbert, N. Labat, A. Touboul

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 759 KB

english, 2006

4

Publisherâs Note: âAccumulated densities of sedimenting particles in turbulent flowsâ [Phys. Fluids 32, 075104 (2020)]

Sozza, Alessandro, Drotos, Gabor, Hernandez-Garcia, Emilio, Lopez, Cristobal

Journal:

Physics of Fluids

Year:

2020

File:

PDF, 617 KB

2020

5

Simultaneous Plasma Lamotrigine Analysis with Carbamazepine, Carbamazepine 10,11 Epoxide, Primidone, Phenytoin, Phenobarbital, and PEMA by Micellar Electrokinetic Capillary Chromatography (MECC)

Lancas, F. M., Sozza, M. A., Queiroz, M. E. C.

Journal:

Journal of Analytical Toxicology

Year:

2003

Language:

english

File:

PDF, 340 KB

english, 2003

6

Point-particle method to compute diffusion-limited cellular uptake

Sozza, A., Piazza, F., Cencini, M., De Lillo, F., Boffetta, G.

Journal:

Physical Review E

Year:

2018

Language:

english

File:

PDF, 942 KB

english, 2018

7

Accumulated densities of sedimenting particles in turbulent flows

Sozza, Alessandro, DrÃ³tos, GÃ¡bor, HernÃ¡ndez-GarcÃa, Emilio, LÃ³pez, CristÃ³bal

Journal:

Physics of Fluids

Year:

2020

File:

PDF, 5.38 MB

2020

8

Thermal stability of Mo-based Schottky contact for AlGaN∕GaN HEMT

Sozza, A., Dua, C., Morvan, E., Grimbert, B., di Forte-Poisson, M.A., Delage, S.L., Zanoni, E.

Journal:

Electronics Letters

Year:

2005

Language:

english

File:

PDF, 69 KB

english, 2005

9

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Evidence of traps creation in GaN/AlGaN/GaN HEMTs after a 3000 hour on-state and off-state hot-electron stress

Sozza, A., Dua, C., Morvan, E., diForte-Poisson, M.A., Delage, S., Rampazzo, F., Tazzoli, A., Danesin, F., Meneghesso, G., Zanoni, E., Curutchet, A., Malbert, N., Labat, N., Grimbert, B., De Jaeger, J

Year:

2005

Language:

english

File:

PDF, 683 KB

english, 2005

10

Inertial floaters in stratified turbulence

Sozza, A., De Lillo, F., Boffetta, G.

Journal:

EPL (Europhysics Letters)

Year:

2018

Language:

english

File:

PDF, 1.10 MB

english, 2018

11

Dimensional transition of energy cascades in stably stratified forced thin fluid layers

Sozza, A., Boffetta, G., Muratore-Ginanneschi, P., Musacchio, S.

Journal:

Physics of Fluids

Year:

2015

Language:

english

File:

PDF, 677 KB

english, 2015

12

The geographic information system of the Turin City Council on the Internet

I. Gauna, A. Sozza

Journal:

Computers, Environment and Urban Systems

Year:

1999

Language:

english

File:

PDF, 476 KB

english, 1999

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